Test Probe Tips

Test probe tips are the part of a test probe that makes contact with the device or component being tested. These tips are typically made from a conductive material, such as a metal or metal alloy, and are designed to make a reliable, low-resistance connection to the device under test. Test probe tips are available in a wide range of sizes, shapes, and materials, and are often specific to the type of test probe or the device being tested. Some common types of test probe tips include pointed tips, which are used to make contact with small or delicate components, and spring-loaded tips, which are used to maintain contact with the device under test even if the probe is moved or bumped. Test probe tips are an important component of test and measurement equipment, and are used in a wide range of applications, including electronics testing, medical device testing, and industrial testing.