On July 22, Micron Technology, a leading memory chip maker, unveiled the industry's highest-density, radiation-hardened single-level cell (SLC) NAND product. With a chip capacity of 256 Gb, this new NAND is the first in Micron's lineup of space-qualified NAND, NOR, and DRAM solutions and now available on the market as the first of its kind from a major memory manufacturer.
Micron highlights the rapid growth of the space economy, driven by booming commercial and government missions. As computing power and artificial intelligence advance, there's a rising need for high-performance technology that can process data directly in orbit. AI-powered edge computing is transforming space operations by enabling spacecraft to analyze sensor data, detect anomalies, and make autonomous decisions—reducing reliance on Earth-based systems and saving precious bandwidth.
Space-grade technology faces harsh conditions such as extreme temperatures, shocks, vibrations, vacuum pressure, and intense radiation from solar particles and cosmic rays. To ensure its radiation-hardened NAND meets mission demands, Micron is conducting rigorous quality and performance testing aligned with NASA's PEM-INST-001 Level 2 process. This includes a year-long screening that covers extreme temperature cycles, defect inspections, and 590 hours of dynamic aging to guarantee spaceflight reliability.
Radiation characterization tests include Total Ionizing Dose (TID) assessments following the U.S. military standard MIL-STD-883 TM1019 Condition D, measuring how much gamma radiation the product can absorb while maintaining functionality which is crucial for understanding mission lifespan. Single Event Effects (SEE) testing, based on ASTM F1192 and JEDEC JESD57 standards, evaluates the impact of high-energy particles on semiconductors to ensure components operate safely in severe radiation environments, minimizing mission failure risks. These insights help space engineers design systems that reduce risks and interruptions.
Though this is Micron's first officially space-certified product, its NAND flash memory has already proven itself through partnerships and customer testing on actual missions. Vincent Pribble, Chief Product Manager at Mercury Systems, says, "Modern space systems capture more complex data, demanding solutions that deliver higher capacity in compact packages and can reliably operate in the high-radiation environment of space for years. Micron's flash memory, at the heart of Mercury's data recorders, has demonstrated outstanding reliability in orbit, enabling breakthrough missions and scientific discoveries that expand our understanding of Earth and beyond.”
Micron's high-density, radiation-hardened flash memory powers the EMIT instrument, capturing 100,000 spectra per second, providing reliable long-term data storage and processing which is the key to mission success.